This manual may contain references to HP or Hewlett-Packard. Please note that Hewlett-. Packard’s former test and measurement, semiconductor products and. A. • Test frequencies – 10 kHz to 10 MHz. • Test signal level – 1 mV to 1 V rms. • % basic AUTO MANUAL DOWN UP. SELF. TEST The A operates over a frequency range of Hz to kHz ually or under HP-IB control. The HP A and HP A Multi-frequency LCR Meters, microprocessor- based impedance . Trigger: internal, external or manual. Measurement terminals.

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Alternating current power line.

HP Part number, appli- cable standards for power plug, power cord color, electrical characteristics and coun- tries using each power cord are listed in the figure.

If Data Ready is set to ON, this state is set when measure- ment data is provided. Their values depend on component lead length and on the distance between the sample and test fixture. This figure appears when Memory Back- up Option is installed.

For connecting the sample to be tested, the A employs measurement termi- nals in a four terminal pair configuration which has a significant measuring advantage for component parameter measurements requir- ing high accuracy in the high frequency region.

Memory data to be preserved has been lost. Test voltage and current can be mon- Power Requirements: Thus, the four terminal pair method combines the advantages of the Figure Note ZERO offset adjustment can be performed at one specified test frequency. Component replacement and internal adjustments must be made by qualified maintenance personnel. Firstly, do the self test. Each pushbutton selects a parameter as follows: Service request status of the A: Table lists gen- eral information.



If lOkHz i lp test frequency is used, C value should be greater than 4yF. Note DC bias is applied to sample through an internal 50kJ resis- tor.

Trigger lamp will begin to fl ash. Fasten it on the rear panel with the two screws The A is set to be talker. Error in dc bias operation: X, B, L and C measurements are possi- ble in R measurements.

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Increase dc bias supply output voltage while monitoring readout on output current me- ter until desired bias current is obtained. General operating procedures for meas- uring an inductance, capacitance or resist- ance circuit component are outlined in Figure Read A capacitance display after allowing time for bias voltage to settle. These programs are listed in Table If range is set to a range which can not make the measurement, range is automatically reset to the nearest range capable of making the measurement.

To obtain reliable measurement results, reduce the ef- fects of component lead impedance by the same methods outlined in the paragraph for High Frequency Measurement.

manua, The 4725a causing residuals, Lo and Co, are shown in the figure. For storing the desired control settings in the memory, proceed as follows: Available measurement range ffiiy be restricted an error message is dis- played on unuseable ranges.


In any correspondence, refer to in- strument by model number and full serial number. Check that A trigger lamp begins to flash. AC power cord is connected to this receptacle and ac power line. Option The figure shows sample circuitry appropriate to A appli- cations.

Index of /~kurt/manuals/manuals/HP Agilent

Accuracy represen- tation applies to a basic instrument. Ranging operation has actuated a range on which the measurement can net be taken at the selected test frequency.

Fasten it to the rear panel with the two screws Multiplies values of accu- manuall equation terms that include a by HP-IB Compatibility This program code can not be used if reference data is not stored.

Accuracy at Multiplier X 0. Refer to para- graph for the errors due to test fix- tures at frequencies above IMHz.

When the ZERO offset adjustments are ‘ performed in high resolution mode to measure small values with high accura- cy”CAL” is displayed about 15 seconds.

Replace top cover and reinstall power cable.